Introduction

The DOP-201 measures and displays the Degree of Polarization (DOP) of a light source in real time on the front panel display. The instrument incorporates a patented maximum & minimum search technique that accurately measures both low and high DOP.

This technique is superior to polarimeter-based methods that are inaccurate at low values of DOP as well as scrambler-based methods which are less accurate at high values of DOP.

The instrument’s wide range includes the S, C and L bands, without calibration. Simultaneous measurement of DOP and optical power level of the light source under test can be used to obtain DOP power dependence and to ensure low insertion loss during depolarizer manufacturing.

Introduction

The ERM-202 is a single or dual channel polarization extinction ratio (PER) meter. When used with a broadband source, it directly measures PER. Single and dual channel models are available.

The single channel instrument can be upgraded to a dual-channel version at a later date. By combining low noise circuitry with a high resolution stepper, the ERM series achieves a PER dynamic range of 50 dB.

Introduction

The OCA-1000 is a multi-channel optical component analyzer capable of performing simultaneous insertion loss (IL), polarization dependent loss (PDL), and Power (P) measurements on multiple optical paths.

The measurement is based on Mueller Matrix method, which offers fast characterization of wavelength dependent optical

parameters that are critical in today’s optical communication systems.

The base model can have up to 8 channels, and the system

is expandable to additional sets of channels for maximum flexibility.

Introduction

The OFDR-1000A is a Polarization Analyzing Optical Frequency Domain Reflectometer (PA-OFDR) operating over the C and L bands.

Unlike other OFDRs on the market, this instrument can perform a full polarization analysis to obtain all 16 Mueller matrix elements. It provides absolute, high resolution, temperature independent, space-resolved measurement of both birefringence (transverse stress) and reflection along an optical path that can contain multiple optical elements and interfaces as well as optical fiber.

Introduction

The PDL-201 uses a patented maximum and minimum search method compliant with TIA/EIA-455-198 to simultaneously measure the Polarization Dependent Loss (PDL), Insertion Loss (IL), and optical power of devices in just 30 MS.

Unlike PDL meters that use the polarization scrambling method, the PDL-201’s max-min technique is useful for both low and high values of PDL. And unlike instruments that use a Mueller Matrix technique, the PDL-201 has a wide wavelength range without calibration.

The measurement speed of the instrument combined with the remote control interfaces allow it to work in conjunction with tunable lasers in automatic or semi-automatic test stations. (Software to facilitate the integration is available).

Introduction

The POD-201 is an FPGA powered polarimeter designed for high speed polarization analysis and monitoring.

The instrument simultaneously measures the four Stokes parameters to yield the instantaneous state of polarization (SOP) and degree of polarization (DOP) of an input light beam.

The unit is controlled with FPGAs that support sampling rates of up to 4MS/s. The POD-201 also features data logging function for long term measurement of polarization changes of up to 1 billions points.

Introduction

The PSGA polarization measurement system is the most accurate product on the market for analyzing PMD, PDL and other polarization related properties of light sources and optical materials.

The patented design utilizes magneto-optic crystals for high accuracy and repeatability.

The PSGA can be delivered with an internal tunable laser, but can also be used with third party lasers, to generate scans of DGD, SOPMD  and PDL.

The instrument has an attached flip-top LCD display design and a VGA port for use with external displays.

Introduction

The PXA-1000 Distributed Polarization Crosstalk (X-Talk) Analyzer is an enhanced white light interferometer that measures space-resolved stress by analyzing stress-induced polarization cross-coupling along a length of polarization maintaining (PM) fiber.

The patented design eliminates strong zero-order interference and reduces the multi-coupling interference common in traditional white light interferometers, both of which can cause “ghost” peaks in the measured signal.

The removal of the “ghost” peaks enables the PXA-1000 to unambiguously identify the magnitudes and locations of actual x-talk peaks, resulting in higher measurement sensitivity, higher dynamic range, and higher spatial measurement accuracy.